Algaas/Ingaas/Algaas Double Pulse Doped Pseudomorphic High Electron Mobility Transistor Structures On Ingaas Substrates

Double pulse doped AlGaAs/InGaAs/AlGaAs pseudomorphic high electron mobility transistor (PHEMT) structures have been grown on InxGa1-xAs (x = 0.025-0.07) substrates using molecular beam epitaxy. A strain compensated, AlGaInAs/GaAs superlattice was used for improved resistivity and breakdown. Excellent electrical and optical properties were obtained for 110-Angstrom-thick InGaAs channel layers with indium concentrations up to 31%. A room temperature mobility of 6860 cm(2)/V s with 77 K sheet density of 4.0 X 10(12) cm(-2) was achieved. The InGaAs channel photoluminescence intensity was equivalent to an analogous structure on a GaAs substrate. To reduce strain PHEMT structures with a composite InGaP/AlGaAs Schottky layer were also grown. The structures also exhibited excellent electrical and optical properties. Transmission electron micrographs showed planar channel interfaces for highly strained In0.30Ga0.70As channel layers. (C) 1997 American Institute of Physics.