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Microstructural, ferroelectric, and dielectric properties of Bi{sub 3.15}Nd{sub 0.85}TiâOââ ceramics

Yajun Qi, Xingguo Xiao, C Y Lu, Xiaoyi Mao,X B Chen

Journal of Applied Physics(2005)

Cited 23|Views2
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Key words
hysteresis loop,electric field,leakage current,dielectric properties,current density,microstructures,dielectric constant
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