Determination Of Zinc Concentration In Gan:Zn,Si From Photoluminescence

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3(2013)

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摘要
Gallium nitride samples codoped with zinc and silicon were fabricated by metal organic chemical vapor deposition. Optical properties of these samples with low-level doped acceptor are investigated by temperature dependent photoluminescence (PL) measurements. PL spectrum shows three peaks labeled as near band edge (NBE), blue luminescence (BL), and yellow luminescence (YL). BL originates from Zn-Ga acceptors in GaN:Zn,Si. It is quenched above 250 K for all samples measured at excitation density of P-exc = 0.2 W cm(-2). The concentration of acceptors responsible for the BL band is estimated for relatively low Zn concentrations by comparing integrated PL intensity of NBE and Zn-related BL bands at 200 K. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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关键词
photoluminescence, gallium nitride, III-V semiconductor, MOCVD, zinc
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