Time-Of-Flight Measurements On Schottky Cdte Nuclear Detectors

Temporal evolution of the time-of-flight current waveforms of Schottky CdTe nuclear detectors as a function of the DC bias duration has been measured at several different temperatures from 278 K to 315 K to investigate the nature of the defects responsible for the polarization phenomena. Three relaxation processes with time constants from less than a second to as long as about a thousand seconds at room temperature are involved in the evolution. Based on the observed temperature dependence, we have concluded that two out of three relaxation processes are attributed to the ionization of defects at 0.54 eV and 0.6 eV. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)