A simple method for depth determination from self-potential anomalies due to two superimposed structures

In this paper, we develop a method to determine the depth to two superimposed sources from a self-potential anomaly profile. The method is based on finding a relationship between the depths to the two superimposed structures from a combination of observations at symmetric points with respect to the coordinate of the sources' centre. Formulae have been derived for two classes of geometric sources: spheres and cylinders. Equations are also formulated to estimate the other model parameters, including the polarisation angle and electric dipole moment of both structures. The proposed method is tested both on synthetic data with and without random noise, as well as real self-potential data from a set of field data collected in Turkey. In all cases, the model parameters obtained are in good agreement with the actual ones.