New development of EPICS based data acquisition system for H-Alpha diagnostic

The H-Alpha diagnostic system has been developed to measure the line integrated intensity in the direction of toroidal and poloidal. The data acquisition (DAQ) system for H-Alpha diagnostics of the Korea Superconducting Tokamak Advanced Research (KSTAR) at the beginning of the first plasma in 2008 was developed with VME form factor digitizer in the Linux OS platform. The VME digitizer module of H-Alpha data acquisition system was modified to measure the low current signal from the photo-multiplier tubes (PMT). The input maximum current values of modified digitizer module are 400 nA and low current data is expressed as the value of the voltage between -10V and +10V. At first time, there was no problem to measure H-Alpha signal, but it could not measure the H-Alpha data signal as the KSTAR Plasma density increased. It exceeds digitizer input range, which means the H-Alpha signal is over 400 nA, so we should manually change the resistor on the digitizer board to measure the 400 nA over current. This is not easy to do and showed instability in the long time operation with high sampling data acquisition. In order to overcome these weak points, a new H-Alpha data acquisition system has been developed with a compact PCI (cPCI) based digitizer and a signal conditioning box for converting the current to voltage in the Linux OS platform. The new data acquisition system was developed based on Experimental Physics and Industrial Control System (EPICS) framework like other KSTAR diagnostics with standard framework (SFW). The main advantages of the new H-Alpha data acquisition system are the capabilities of calculating line integrated intensity during the plasma shot and displaying it in run-time. During the plasma shot, the new data acquisition system performs segment archiving data in MDSplus DB of KSTAR central storage. This paper describes the overview of new H-Alpha data acquisition system with signal condition box, the results of its implementation. (c) 2015 Elsevier B.V. All rights reserved.