Understanding the Failure Mechanisms of Protection Diodes During System Level ESD: Toward Repetitive Stresses Robustness
IEEE Transactions on Electron Devices(2012)
Abstract
In electronic systems, the ever-increasing level of integration is paced by component scaling. Consequently, system-level protection improvements in electrostatic discharge (ESD) reliability during a device's lifetime are mandatory. To this end, we have investigated bidirectional system-level ESD protection diodes that have been subjected to repetitive human metal model stresses. Our goal was to d...
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Key words
Electrostatic discharges,Stress,Robustness,Junctions,Leakage current,Failure analysis,Degradation
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