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High-Resolution X-Ray Diffractometric, Topographic and Reflectometric Studies of Epitaxial Layers on Porous Silicon Destined for Exfoliation

K. Mazur,K. Wieteska,W. Wierzchowski,J. Sarnecki,D. Lipinski,A. Brzozowski,C. Paulmann

X-RAY SPECTROMETRY（2015）

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