Observations Of Memory Effects And Reduced Breakdown Delay Via Penning Gas Mixtures In High-Power Microwave Dielectric Window Discharges
IEEE TRANSACTIONS ON PLASMA SCIENCE(2016)
Abstract
Recent improvements in high-power microwave (HPM) source power and portability make protecting sensitive electronics from electronic attack critically important. The research reported in this paper examined basic phenomena associated with a distributed area, highly attenuating gas discharge for HPM attack protection. In particular, the research examined gas breakdown delay since effective protection against HPM attack requires rapid activation, significantly faster than the hundreds of nanoseconds typical of HPM pulses. These studies, conducted in mixtures of neon, argon, helium, and xenon gases from 50 to 150 torr, demonstrate how polycarbonate window precharging metastable-excited atoms and appropriate gas composition enable Penning effects to significantly reduce breakdown delay.
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Key words
Dielectric barrier discharge, electronic attack (EA), high-power electromagnetics (EMs), high-power microwave (HPM), HPEM, intentional EM interference, Penning effect, Penning ionization, plasma breakdown, plasma shielding
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