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Research on Reliability and Lifetime of Solid Insulation Structures in Pulsed Power Systems

Liang Zhao,Jian-cang Su,Xi-bo Zhang,Ya-feng Pan,Li-min Wang,Xu Sun,Rui Li

IEEE Transactions on Plasma Science（2013）

Cited 15|Views11
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Abstract
Based on the Weibull statistical distribution and the thickness effect on dielectric breakdown strength EBD, a formula to evaluate the reliability of solid insulation structures (SISs) in pulsed power systems is derived. By calculating this formula, it is concluded that an increase of 1.4 times in the dielectric thickness d or a 3/4 decrease in the applied voltage U will increase the reliability o...
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Key words
Reliability,Power system reliability,Dielectrics,Plastics,Electric breakdown,Statistical distributions
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