Sub-Angstrom Resolution With A Phonograph Cartridge As Bidimensional Nanodisplacement Sensor

Tullio Mariani,Carlo Frediani,Cesare Ascoli

REVIEW OF SCIENTIFIC INSTRUMENTS（1995）

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摘要

A simple and reliable displacement sensor is proposed, which is able to detect axial and transverse displacement with a resolution of the order of 0.01 Angstrom. It is based on an inexpensive device borrowed from old-style audio reproducers. (C) 1995 American Institute of Physics.

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关键词

atomic force microscopy,piezoelectric material,spatial resolution

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