Influence of deposition conditions on morphological, structural, optical and electro-physical properties of ZnSe films obtained by close-spaced vacuum sublimation

ZnSe thin films were deposited on well-cleaned glass substrates by the close-spaced vacuum sublimation technique. Various structural, sub-structural and optical properties have been investigated through scanning electron microscopy (SEM), X-ray diffraction (XRD), spectral photometry, Raman spectroscopy and Fourier transform infrared (FTIR) spectroscopy. Electro-physical studies were performed using an ITO/ZnSe/In “sandwich” structure. The correlation between the films structure and their optical and electro-physical properties was estimated. The evaluated films were fine-crystalline, with their grain size depending on the substrate temperature. The optical band gap was estimated through optical measurements and the high optical qualities of the ZnSe films were confirmed by Raman and FTIR analyses.