Oxidation Effect in Octahedral Hafnium Disulfide Thin Film.

ACS nano(2016)

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摘要
In this project a software tool to extract characteristic parameters froma voltage sag waveform has been successfully developed and tested. The realrecorded voltage sag waveform was acquired from IEEE Working GroupPI 159.2 Power Quality Event Characterisation webpage. The development ofthis software tool was done using Matlab environment. Theories and methodson voltage sag characterization was studied and analyzed. The characteristicparameters extraction is done on two conditions of sag, which are voltage sagin single phase condition and voltage in for three phase condition. Two signalprocessing methods have been applied in order to extract the characteristic ofvoltage sag in these two conditions. The applied methods are the rmssequence and Discrete Fourier Transform. The extracted parameters orindices of voltage sag in this project are the sagu0027s magnitude, duration, phaseangle jump, energy, and severity, type of sag, PN factor and the characteristicvoltage. These parameters are the indices which characterize the voltage sagin single phase and three phase condition. The values of these parameters aredisplayed in the Graphical User Interface of the software tool that has beendeveloped. These values has been compared with the results obtain from themanual calculation and from the simulation results on the Matlab rms andDiscrete Fourier block set.
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关键词
oxidation,glovebox,field effect transistor
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