Non-Destructive Displaying Defects For Luminescence Image Of Photovoltaic Panel Arrays

The non-destructive displaying defects of luminescence imaging is presented for inspecting silicon solar cell characterization of photovoltaic panel. The displaying system with photoluminescence can be applied to cleaning robotic device for tracing panel defects after cleaning photovoltaic panel arrays. A comparison method of the photoluminescence images with various illuminations has high sensitivity to reveal micro crack defect by image filter and threshold processes. It is simple to display the micro crack of commercial photovoltaic panel by non-contact inspection of photoluminescence.