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Secondary ion mass spectrometry imaging of biological cells and tissues.

ELECTRON MICROSCOPY: METHODS AND PROTOCOLS, 3RD EDITION(2014)

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摘要
Secondary ion mass spectrometry (SIMS) is capable of providing detailed atomic and molecular characterization of the surface chemistry of (bio)molecular samples. It is one of a range of mass spectrometry imaging techniques that combine the high sensitivity and specificity of mass spectrometry with the capability to view the distribution of analytes within solid samples. The technique is particularly suited to the detection and imaging of small molecules such as lipids and other metabolites. A limit of detection in the ppm range and spatial resolution <1 μm can be obtained. Recent progress in instrumental developments, including new cluster ion beams, the implementation of tandem mass spectrometry (MS/MS), and the application of multivariate data analysis protocols promise further advances. This chapter presents a brief overview of the technique and methodology of SIMS using exemplar studies of biological cells and tissue.
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关键词
ToF-SIMS,Imaging,Mass spectrometry,Cellular analysis,Tissue analysis,Molecular depth profiling,3D SIMS
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