Beamlet deflection due to beamlet-beamlet interaction in a large-area multiaperture negative ion source for JT-60U.
REVIEW OF SCIENTIFIC INSTRUMENTS(2008)
Abstract
The JT-60U negative ion source has been designed to produce high current beams of 22 A through grids of 1080 apertures (five segments with nine rows of 24 apertures). One of the key issues is to steer such a high current beam through the multiaperture grids in order to focus the overall beam envelope because the beamlet-beamlet interaction may deflect the outer beamlets outward due to unbalanced space charge repulsion. To clarify the beam deflection in the JT-60U negative ion source, the beamlet trajectory in a multiaperture ion source was calculated by a three-dimensional simulation code. The measured angles of the outmost beamlets were in agreement with the calculated results where space charge of the beamlets was taken into account. It is noticed that the deflection of the outermost beamlet due to the beamlet-beamlet interaction is saturated at 5.2 mrad outward for beamlets more than ten. (C) 2008 American Institute of Physics.
MoreTranslated text
Key words
three dimensional,space charge
AI Read Science
Must-Reading Tree
Example
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined