MEMS disk resonator gyroscope with integrated analog front-end

Baltimore, MD(2013)

引用 3|浏览23
暂无评分
摘要
We present a 2 mm diameter, 35 μm thick disk resonator gyro (DRG) fabricated in <;111> silicon with integrated 0.35 μm CMOS analog front-end circuits in the Invensense NF process. This process incorporates a wafer-level vacuum seal, yielding a quality factor (Q) of 2800 at the DRG's 78 kHz resonance frequency. After performing electrostatic tuning to enable mode-matched operation, this DRG achieves a 63 μV/°/s sensitivity. Resonator vibration in the sense and drive axes is sensed using capacitive transduction, and amplified using a low-noise, on-chip integrated circuit. This allows the DRG to achieve Brownian noise-limited performance. The angle random walk (ARW) is measured to be 0.01 (*/sec)/√Hz and the bias instability is 30 °/hr.
更多
查看译文
关键词
cmos analogue integrated circuits,q-factor,circuit stability,gyroscopes,micromechanical resonators,vibrations,arw,brownian noise-limited performance,cmos analog front-end circuits,drg,mems disk resonator gyroscope,angle random walk,bias instability,capacitive transduction,electrostatic tuning,frequency 78 khz,integrated analog front-end,invensense nf process,mode-matched operation,on-chip integrated circuit,quality factor,resonance frequency,resonator vibration,size 0.35 mum,size 2 mm,size 35 mum,wafer-level vacuum seal,q factor
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要