Fault Injection Framework for embedded memories

Defect and Fault Tolerance in VLSI and Nanotechnology Systems(2013)

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摘要
Due to scalability issues of existing semiconductor memories emerging non-volatile memory technologies are gaining increasing interest. Their promising features like non-volatility, low-power consumption, and great scalability are expected to meet demands of upcoming digital systems. Unfortunately, due to their characteristics they often require special management. Moreover, due to certain properties, e.g. like limited endurance, their applicability in some cases can be restricted. As a result, selection of a non-volatile technology appropriate for a target system can be difficult. This paper proposes an approach which facilitates a design process of a system incorporating non-volatile memories. It presents a tool which generates non-volatile memory model which can be used not only in system's simulations but also in emulations in hardware.
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关键词
embedded systems,fault diagnosis,random-access storage,semiconductor device models,semiconductor device testing,semiconductor storage,design process,embedded memories,fault injection framework,nonvolatile memory model,nonvolatile memory technologies,scalability issues,semiconductor memories,system simulations
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