Preparation and characterisation of exfoliated graphene for quantum resistance metrology

G Rietveld,H J Van Elferen,A J M Giesbers,A Veligura,U Zeitler,K S Novoselov,B J Van Wees,A K Geim,J C Maan

Electronic Notes in Theoretical Computer Science（2010）

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摘要

Exfoliated graphene samples have been prepared for use in quantum resistance metrology. Good progress is recently made in achieving contact resistances to graphene of less than 50 Ω. Details are presented on the handling and measurement of graphene samples.

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关键词

contact resistance,graphene,c,contact resistances,exfoliated graphene,quantum resistance metrology,temperature,gold,metrology,resistance,electrons,temperature measurement,chromium,optical microscopy,physics,annealing

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