A multi-channel charge readout IC with offset calibration for X-ray industrial inspection
Image and Signal Processing（2012）
Abstract
A multi-channel charge readout integrated circuit (IC) which converts detector charge to analog voltage with offset calibration for X-ray industrial inspection is described. The charge readout IC provides 64 channels of circuit having a max dynamic range of 14 bit and is comprised of charge amplifier gain control, timing generator, shift register chain, charge amplifier array, sample/hold (S/H) stage amplifier and driver etc. It was fabricated using 0.8 um standard CMOS process, and occupies a die area of 3.1 mm × 10.9 mm. It operates at 4 MHz, consumes 45 mW from 5 V supply and 3.5 V as reference, and has a demonstrated output noise performance of 600 uVrms on 0.5 pF of charge amplifier gain capacitance and 33 pF of photodiode (PD) terminal capacitance.
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Key words
cmos integrated circuits,x-ray applications,amplifiers,calibration,inspection,integrated circuits,x-ray industrial inspection,charge amplifier array,charge amplifier gain capacitance,charge amplifier gain control,max dynamic range,multichannel charge readout ic,multichannel charge readout integrated circuit,offset calibration,photodiode terminal capacitance,power 45 mw,sample-hold stage amplifier,shift register chain,standard cmos process,timing generator,voltage 3.5 v,voltage 5 v,dynamic range,multi-channel charge readout ic
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