Analysis of Intrinsic Variation of Data Retention in Phase-Change Memory Using Phase-Field Method
Electron Device Letters, IEEE（2013）
Key words
monte carlo methods,nucleation,phase change memories,monte carlo results,data retention,nucleated crystallites,phase change memory,phase field method,retention time,size 10 nm,stochastic nucleation,temperature 70 degc,chalcogenide,crystallization,nucleation and growth (ng),phase field,phase-change memory (pcm),reliability,retention,mathematical model,solid modeling
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