Quality factor enhancement in lamb wave resonators utilizing AlN plates with convex edges

Solid-State Sensors, Actuators and Microsystems Conference(2011)

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摘要
A novel Lamb wave resonator utilizing an aluminum nitride (AlN) plate with convex edges to enhance the quality factor (Q) is demonstrated for the first time. The finite element analysis (FEA) simulation results show that the mechanical energy can be more efficiently confined in the center of the AlN Lamb wave resonator by using the convex edges instead of the flat edges. Specifically, the measured frequency response for a 491.8-MHz AlN Lamb wave resonator with convex edges yields a Q of 3,280 which represents a 2.6× enhancement in Q over a 517.9-MHz AlN Lamb wave resonator with flat edges. Moreover, a 419.3-MHz Lamb wave resonator on an AlN/SiO2 composite plate with convex edges yields a Q of 4,792, representing a 3.8× increase in Q.
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关键词
iii-v semiconductors,q-factor,aluminium compounds,finite element analysis,surface acoustic wave resonators,wide band gap semiconductors,aln,fea simulation,aluminum nitride plate,convex edges,finite element analysis simulation,frequency 419.3 mhz,frequency 491.8 mhz,frequency 517.9 mhz,lamb wave resonators,mechanical energy,quality factor enhancement,rf mems,aluminum nitride (aln),energy loss,piezoelectric resonators,quality factor (q),tether loss,quality factor,frequency response,lamb wave,electrodes,shape,resonant frequency,silicon,q factor,edge detection
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