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Measurement of third-order dispersion in a Hong-Ou-Mandel interferometer

A H Quarterman,John E Carroll,A Wonfor,R V Penty,I H White

Lasers and Electro-Optics（2013）

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Abstract
The effect of third-order dispersion in a Hong-Ou-Mandel interferometer is investigated using a ZnSe crystal as a dispersive medium. A value for the TOD coefficient of ZnSe is extracted which is consistent with literature values.
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ii-vi semiconductors,disperse systems,light interferometers,light interferometry,optical dispersion,optical variables measurement,hong-ou-mandel interferometer,znse,dispersive medium,third-order dispersion coefficient measurement,zinc selenide crystal,optical interferometry,crystals,optical fibers,photonics
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