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Dual Threshold Voltage Adder For Robust Sub-Vt Operation In 65nm Technology

SOI-3D-Subthreshold Microelectronics Technology Unified Conference(2013)

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摘要
With the increased focus on power efficiency, there is a push towards lowering the supply voltage and operating the design in the sub-threshold regime. While this is good for lowering the active power, it makes certain circuits more susceptible to single-event effects due to poor Ioff/Ion ratio. The 28-T mirror adder is a key building block for many arithmetic and digital signal processing systems. Yet, the mirror full adder is vulnerable to failure in sub-threshold operation due to its long chain of transistors in series and xor-parallel configuration. By replacing the transistors in the vulnerable configuration with low-Vt transistors, we are able to strengthen the circuit for subthreshold operation. In this paper, we look at the effect of a dual-Vt version of the basic mirror adder circuit in the 65nm technology node.
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关键词
adders,integrated circuit design,integrated logic circuits,low-power electronics,radiation hardening (electronics),xor parallel configuration,digital signal processing,dual threshold voltage adder,mirror adder,mirror full adder,power efficiency,single event effect,size 65 nm,supply voltage,low power electronics
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