Low power operating bipolar TMO ReRAM for sub 10 nm era

Electron Devices Meeting(2010)

引用 87|浏览18
暂无评分
摘要
The bottle neck of ReRAM (Resistive RAM) for post-NAND storage application is high operational current. Herein, we report a method to acquire low operational currents from a hetero structure ReRAM (AlOx/TiOx). The mechanism study of the hetero structure ReRAM reveals that the AlOx layer as a tunnel barrier is critical for switching, and thus switching parameters are governed by the properties of the AlOx layer. By tuning tunnel oxide properties along with adopting 5 nm sized “Dash BE”, operational currents of ≤10 μA have been achieved from this hetero structure device.
更多
查看译文
关键词
low-power electronics,random-access storage,resistive ram,low power operating bipolar tmo reram,post-nand storage,size 10 nm,switching parameters,tunnel oxide properties,tin,tunneling,oxidation,switches,sputtering,low power electronics
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要