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Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit from 16–300 K

Cheryl J. Marshall,Paul W. Marshall,Raymond L. Ladbury,Augustyn Waczynski,Rajan Arora,Roger D. Foltz,John D. Cressler,Duncan M. Kahle,Dakai Chen,Gregory S. Delo,Nathaniel A. Dodds,Jonathan A. Pellish,Emily Kan,Nicholas Boehm,Robert A. Reed,Kenneth A. LaBel

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2010）

Cited 25|Views2
Key words
Cryogenic latchup,low temperature electronics,readout integrated circuit,single event effects,single event latchup
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