Bend Loss Characterization Of Direct Write Rib Waveguides Induced In Ge0.2se0.8 Chalcogenide Glass Using Electron Beams

Belek-Antalya（2009）

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摘要

Rib waveguides in Ge0.2Se0.8 films are fabricated by the direct write of electron beams. Numerical analysis shows that bend loss decreases with electron beam exposure count for constant bend radius.

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关键词

chalcogenide glasses,electron beams,germanium compounds,numerical analysis,optical fabrication,optical losses,optical waveguides,Ge0.2Se0.8,bend loss,chalcogenide glass,direct write rib waveguides,electron beam exposure,numerical analysis

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