Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.

Reliability Characterization of 32nm High-K Metal Gate SOI Technology with Embedded DRAM

Steve Mittl, Ann Swift,Ernest Wu,Dimitris Ioannou,Fen Chen, Greg Massey,Nilufa Rahim, Mike Hauser, Paul Hyde

IEEE International Reliability Physics Symposium（2012）

Cited 4|Views5
Key words
High-K,Metal Gate,eDRAM,eFUSE,BTI,HCI,SHE,SER,SRAM,Self Heating
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined