High-κ/metal Gate Low Power Bulk Technology - Performance Evaluation of Standard CMOS Logic Circuits, Microprocessor Critical Path Replicas, and SRAM for 45nm and Beyond
PROCEEDINGS OF TECHNICAL PROGRAM 2009 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS（2009）
关键词
CMOS logic circuits,SRAM chips,field effect transistor circuits,low-power electronics,microprocessor chips,silicon compounds,NFET drive current,PFET drive current,SRAM chips,SiON,microprocessor critical path replicas,size 45 nm,standard CMOS logic circuits
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