Microwave characterization of multi-walled carbon nanotube arrays
Microwave Conference（2011）
摘要
A vertically aligned multi-walled carbon nanotube (VACNT) film has been characterized by rectangular waveguide measurements. The complex scattering parameters (S-parameters) are measured by a vector network analyzer at X-band frequencies. The effective complex permittivity and permeability of the VACNT film have been extracted using the Nicolson-Ross-Weir (NWR) approach. The extracted parameters are verified by full wave simulations (CST - Microwave Studio) and very good agreement has been obtained. A systematic error analysis is presented and the errors are within the acceptable range. The performance of VACNT films as an absorber is examined, and comparison with the conventional carbon loaded materials shows that a 90% size reduction is possible whilst maintaining the same absorption level.
更多查看译文
关键词
s-parameters,carbon nanotubes,measurement errors,network analysers,permittivity,rectangular waveguides,nicolson-ross-weir approach,x-band frequencies,complex scattering parameters,effective complex permittivity,full wave simulations,microwave characterization,permeability,rectangular waveguide measurements,systematic error analysis,vector network analyzer,vertically aligned multiwalled carbon nanotube,absorption,vertically aligned multiwalled carbon nanotubes (vacnt),waveguide,s parameters,carbon nanotube,scattering parameters,films,systematic error
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要