Accuracy-improved through-silicon-via model using conformal mapping technique
Electrical Performance of Electronic Packaging and Systems(2011)
摘要
In this paper, the effects of slow wave and dielectric quasi-TEM modes in through-silicon via (TSV) are analyzed by using the currently used TSV model. By the E-field plot, if pitch to-diameter ratio is small in TSV structure, it is found out that some electrical behaviour of the TSVs is not well characterized by conventional model. This paper proposes a general and analytic model for the electrical modeling of through-silicon via (TSV) based on the conformal mapping method to modify the conventional model in admittance (CG) parts. With the improved model, the electrical performance of the modified model agrees very well with full-wave simulation up to 40GHz for small normalized pitch TSV.
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关键词
integrated circuit interconnections,integrated circuit modelling,conformal mapping technique,dielectric quasi-tem modes,electrical modeling,frequency 40 ghz,pitch to-diameter ratio,slow wave modes,through-silicon-via model,conformal map,through silicon via
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