When good trigger circuits go bad: A case history

Alex Gerdemann,James W Miller,Michael Stockinger,Norman Herr,Allan Dobbin, Reyhan Ricklefs

Electrical Overstress/Electrostatic Discharge Symposium（2011）

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摘要

A case history is presented of an advanced latched dual time constant ESD transient trigger circuit design. An unexpected failure occurred with this design which interfered with functional operation of the device. Analysis of the failure is presented along with successful circuit fixes and techniques that ensure safe operation of these circuits.

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关键词

electrostatic discharge,failure analysis,flip-flops,logic design,trigger circuits,case history,latched dual time constant esd transient,trigger circuit design,resistors,logic gate,logic gates,time constant,circuit design

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