20V-high speed low cost arbitrary waveform generator for ICs immunity test

Electromagnetic Compatibility(2011)

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摘要
A >;30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz - 6 GHz) power amplifier allowing >; 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
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关键词
field programmable gate arrays,immunity testing,integrated circuit testing,power amplifiers,transceivers,waveform generators,fpga transceivers,rf design class,arbitrary waveform generator,broadband power amplification,integrated circuit immunity test,power amplifier,resistive weighting networks,rise time,sampling rate,transceiver channels,voltage 20 v,resistors,signal generators,field programmable gate array
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