Deformation Twinning Avalanche Behavior and Macroscopic Yield Stress in Polycrystalline Pure Ti

Go MURASAWA, Tadaaki SATAKE,Atsushi TAKAHASHI, Yuki IKEDA

The Proceedings of the Materials and Mechanics Conference(2019)

引用 0|浏览3
暂无评分
摘要
The aim of present study is to investigate the relationship between deformation twinning avalanche behavior and macroscopic yield stress arising in polycrystalline pure Ti under mechanical loading. First, a commercial polycrystalline pure Ti palate is prepared, and the two types of micropillar specimens are fabricated from the plate. One is single crystal and bicrystal micropillar specimens which size is several micro meter, fabricated by Focus Ion Beam (FIB) technique. The other is polycrystalline micropillar specimens which size is from several dozen to several hundred micro meter, fabricated by in-house processing machine. Second, compression tests are performed by in-house micro compression test machines for the micropillar specimens. At the same time, acoustic emission (AE) monitoring is conducted to measure deformation twinning initiation. The relationship between deformation twinning avalanche behavior and macroscopic yield stress arising in polycrystalline pure Ti is discussed from the present experimental results.
更多
查看译文
关键词
macroscopic yield stress,deformation
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要