Multi-scale Modeling of Low Dose-Rate Total Dose Effects in Advanced Microelectronics
2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS（2008）
Key words
SPICE,integrated circuit modelling,leakage currents,radiation effects,SPICE simulation,low dose-rate total dose effects,multiscale microelectronics modeling,radiation effects,subthreshold leakage current
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