Electron beam test results with a DC-coupled single-sided strip detector

Because silicon strip sensor has a high position resolution compared to the other detectors such as proportional chamber, drift chamber, etc., it has been used in medical imaging, high energy experiment, and space science. We designed and fabricated DC-coupled single-sided silicon strip sensors in a 5-inch fabrication line, and developed the signal readout electronics system. We reported the electrical characteristics of the sensors such as capacitances and leakage currents as a function of bias voltage in the 2005 Nuclear Science Symposium including results of the radiation damage test and charge collection efficiencies for various sensor designs, and the signal-to-noise ratio (SNR) measurement results by using a 90Sr beta-source and a 45 MeV proton beam were also reported in the 2006 Nuclear Science Symposium. In this meeting we present results of a beam test performed in September 2006 at CERN (European Organization for Nuclear Research) beam facility by using a 150 GeV electron beam with the DC-coupled single-sided silicon strip sensor including readout electronics.