Temperature dependence of the high frequency response of Permalloy thin films
San Diego, CA（2006）
Abstract
This study aims to determine the role of electron scattering in the damping mechanisms of magnetization and electrical resistivity of Permalloy thin films at varying temperatures. The complex dynamic susceptibility of the magnetic thin films are measured using ferromagnetic resonance technique. The resistivity follows a quadratic law with temperature which is attributed to electron-electron and electron-magnon scattering in the metallic magnetic materials.
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Key words
permalloy,electrical resistivity,ferromagnetic materials,ferromagnetic resonance,magnetic susceptibility,magnetic thin films,magnetisation,magnons,metallic thin films,feni,permalloy thin films,complex dynamic susceptibility,damping mechanisms,electron-electron scattering,electron-magnon scattering,magnetization,metallic magnetic materials,quadratic law,electron scattering,scattering,electrical resistance,electric resistance,transistors,electrons,thin film,damping,high frequency,magnetic materials,complex dynamics,frequency response
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