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Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon.

S Karanth,S Soujanna, R Venkatraman,SS Jagini, N Venkatesh,JC Rao,H Udayakumar,S Manohar, KP Sheshadri,S Talapatra,P Mhatre,J Abraham,R Parekhji

Bangalore（2002）

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关键词
deep sub-micron,timing closure,functional verification,electrical analysis,design-closure
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