Optimization of 2.14 Um(2) 6T-Sram Cell by Using Cell-Like Test Structures

S Hsieh,RF Tsui, W Lin,JJ Liaw,KYY Doong,CMM Wu

ICMTS 2004 PROCEEDINGS OF THE 2004 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES（2004）

Cited 0|Views2

Key words

SRAM chips,circuit optimisation,integrated circuit design,integrated circuit measurement,integrated circuit yield,0.13 micron,6T-SRAM cell optimization,SRAM-cell process shrinking,cell-like test structures,process-window optimization,yield impact

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined