Beam Diagnostic Systems and Their Use in the New Iucf Beam Line
Particle Accelerator Conference, 1995, Proceedings of the 1995（1995）
Key words
beam handling equipment,particle beam diagnostics,HIPIOS,IUCF beam line,IUCF high intensity polarized ion source,automatic emittance measurements,beam centering,beam diagnostic systems,injector cyclotron,nonintercepting beam position monitors
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