Thermal design considerations for Greek cross test structures
Monterey, CA, USA(2003)
Abstract
This paper analyses the temperature rises associated with the currents forced during the measurement of Greek cross test structures. Simulations were performed using Finite Element (FE) analysis software which indicated that the temperature can be dramatically reduced by decreasing the arm length and increasing the pad size of the Greek cross. Using these design rules it was practically confirmed that higher currents could be forced through Greek crosses without significant Joule heating. As a result the voltage sensed when the Greek cross is measured is increased making the resolution of the voltmeter a less important issue.
MoreTranslated text
Key words
finite element analysis,integrated circuit design,integrated circuit testing,temperature distribution,voltmeters,finite element analysis software,greek cross test structures,joule heating,arm length,pad size,temperature rises,thermal design considerations,voltmeter,heating,finite element,design rules,voltage,finite element methods,software performance,testing
AI Read Science
Must-Reading Tree
Example
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined