Large signal load-pull measurements using six-port reflectometers

Deshours, F., Eric Bergeault, Louis Jallet,Bernard Huyart

Boulder, CO, USA（1994）

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摘要

This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<>

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关键词

computerised instrumentation,microwave reflectometry,power transistors,semiconductor device testing,solid-state microwave devices,2 ghz,600 mum,mesfet,active load-pull measurement,calibration,large signal characterisation,nonlinear characterization,six-port junctions,six-port reflectometers,measurement system

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