Studies of Double-Sided, Double Metal Silicon Strip Detectors
IEEE Conference on Nuclear Science Symposium and Medical Imaging（2003）
关键词
capacitance measurement,position sensitive particle detectors,semiconductor counters,semiconductor device noise,AC coupled detectors,CLEO-II vertex detector,Si microstrip detector,capacitance,double-metal,double-sided,noise,polysilicon bias resistors,punch-through biasing,signal
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