Investigation of single quantum Hall device of resistance standard in NIM
Precision Electromagnetic Measurements（2014）
Abstract
We report in CPEM 2014 our latest results of the study of single quantum Hall device for the resistance standard in National Institute of Metrology, China (NIM). Experimental results indicate quantized Hall devices with satisfied longitudinal resistance, low contact resistance, and good breakdown current are obtained. Comparison of the quantum Hall resistance to a precise transfer resistance standard is made using direct current comparator (DCC). A measurement resolution on the level of 10-7 is obtained which is limited by the DCC resolution.
MoreTranslated text
Key words
hall effect devices,iii-v semiconductors,aluminium compounds,contact resistance,current comparators,gallium arsenide,measurement standards,quantum hall effect,semiconductor device breakdown,two-dimensional electron gas,2d electron gas,gaas-algaas,breakdown current,direct current comparator,longitudinal resistance,low contact resistance,quantum hall resistance,resistance standard,single quantum hall device,2deg,augeni contact,quantum hall effect (qhe),ohmic contact,resistance metrology
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined