Electrical and chemical characterization of thin epoxy layers for high voltage applications
Electrical Insulation and Dielectric Phenomena（2014）
Abstract
In this work epoxy based, mineral filled, thin layers are studied. Results of broadband dielectric spectroscopy ranging from -150°C to 100°C and 0.01 Hz to 1 MHz are presented. Fourier transform infrared spectroscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and also X-ray diffraction were used for chemical characterization of the materials. On the base of the results, proper material candidates can be selected for a desired application.
MoreTranslated text
Key words
fourier transform spectra,x-ray chemical analysis,x-ray diffraction,coatings,electric properties,filled polymers,infrared spectra,paints,scanning electron microscopy,fourier transform infrared spectroscopy,broadband dielectric spectroscopy,chemical characterization,electrical characterization,energy dispersive x-ray spectroscopy,epoxy based thin layer,high voltage applications,mineral filled thin layer,temperature -150 c to 100 c,thin epoxy layer
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined