Constructive Methods Of Functioning Assurance Of Memory Microcircuits At Radiation Influence
Microwave & Telecommunication Technology（2014）
关键词
hardness,integrated circuits,composite tungsten-copper,electron irradiation,electron radiation,electron volt energy 1.8 MeV,electron volt energy 23.3 MeV,functioning assurance,hardness,memory microcircuits,programmable ROM,proton radiation,radiation influence,screen protective properties
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