The Resilience Wall: Cross-Layer Solution Strategies

Subhasish Mitra,Pradip Bose,Eric Cheng,Chen-Yong Cher,Hyungmin Cho,Rajiv Joshi,Young Moon Kim,Charles R. Lefurgy,Yanjing Li,Kenneth P. Rodbell,Kevin Skadron,James Stathis,Lukasz Szafaryn

Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test（2014）

引用 37|浏览1

关键词

circuit reliability,network synthesis,architecture levels,circuit-level faults,cross-layer resilience,cross-layer solution strategy,embedded systems,hardware failures,power wall,resilience wall,software-level effects,supercomputers,system designs,system stack,transistors

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要