A 32 nm Embedded, Fully-Digital, Phase-Locked Low Dropout Regulator for Fine Grained Power Management in Digital Circuits
Solid-State Circuits, IEEE Journal of （2014）
摘要
The need for fine-grained power management in digital ICs has led to the design and implementation of compact, scalable low-drop out regulators (LDOs) embedded deep within logic blocks. While analog LDOs have traditionally been used in digital ICs, the need for digitally implementable LDOs embedded in digital functional units for ultrafine grained power management is paramount. This paper presents a fully-digital, phase locked LDO implemented in 32 nm CMOS. The control model of the proposed design has been provided and limits of stability have been shown. Measurement results with a resistive load as well as a digital load exhibit peak current efficiency of 98%.
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关键词
CMOS digital integrated circuits,digital integrated circuits,low-power electronics,CMOS,digital IC,digital circuits,digital functional units,fine grained power management,logic blocks,phase locked LDO,phase-locked low dropout regulator,size 32 nm,Power management,digital LDO,digital design,low dropout regulator,low power design,phase lock loop,voltage regulators
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