Energy control paradigm for compliance-free reliable operation of RRAM
Waikoloa, HI(2014)
Abstract
We demonstrate reliable RRAM operation by controlling the forming energy via short voltage pulses (picosecond range) which eliminates the need for a current compliance element. We further show that the dissipated energy during forming and SET/RESET processes plays a critical role. The SET/RESET cycling endurance of thus formed devices is shown to also be dependent on the SET/RESET energy. Multiple-pulse forming is also investigated as a method to further tighten the control of forming energy with promising endurance results.
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Key words
circuit reliability,power control,random-access storage,rram,set-reset cycling process,compliance-free reliable operation,current compliance element elimination,energy dissipation,forming energy control paradigm,multiple-pulse forming,short voltage pulse,current compliance,pulsed forming,reliability,switches,resistance
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