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单片机传输系统EMP损伤效应研究

Ai-bin ZHAI,Zhi-tong CUI, Hong-zhi WU,Xiang-yue CHEN,Xin NIE,Bei-yun SUN

Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology（2010）

Cited 3|Views5
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Abstract
搭建了一套小型单片机数据传输系统,研究了电流注入环境下系统的电磁脉冲(EMP)敏感单元、损伤阈值,结合具体的电路结构,对系统失效原因进行了分析.实验结果表明,MAX232芯片是系统的EMP敏感单元,不同批次的器件其EMP损伤阈值不同.研究结果可为系统级EMP损伤效应研究提供实验方法及数据参考.
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Key words
Current injection,Damaged effect,EMP,Single-chip system
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